Used KLA / TENCOR 7700M Surfscan #131420 for sale
KLA / TENCOR 7700M Surfscan is a high-precision, high-speed wafer testing and metrology equipment designed to provide accurate surface measurements and defect inspections on various types of semiconductor wafers. It has the highest throughput and resolution available in the industry and is used by semiconductor manufacturers to ensure quality in their products. KLA 7700M Surfscan includes several advanced technologies that allow it to achieve its high performance. At the heart of the system is the Multi-Channel Detection Architecture (MDA). This is an optical design which employs advanced sensing technology and image processing algorithms to produce an image of the wafer's surface with unparalleled accuracy. The unit also utilizes a specialized high resolution scanning stage that allows it to quickly image the surface of the wafer with a highly accurate two-dimensional grid pattern. Additionally, it includes an automated defect classification machine that can be used to identify and locate defects on the wafer using machine learning algorithms. The tool is highly adaptable and can be used to measure a variety of wafer types including memory, logic, logic integrated circuits, and display applications. The measurement parameters are also adjustable depending on the type of wafer being tested. It is capable of collecting multiple metrics including scan spacing, positional accuracy, surface roughness, and defect size which can all be used to assess the quality of the wafer. TENCOR 7700M Surfscan is an invaluable tool for any semiconductor company looking to maximize the quality and reliability of their products. It is the only wafer testing and metrology asset of its kind and provides unparalleled accuracy and speed, while also being highly adaptable to different wafer types. By providing a reliable and accurate means of assessing wafer quality, the model can help to ensure that manufacturing remains consistent and high-quality products are produced.
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