Used KLA / TENCOR 7700M Surfscan #145603 for sale

KLA / TENCOR 7700M Surfscan is a wafer testing and metrology equipment designed for automated, high-precision surface analysis. The system utilizes an automated inspection platform to enable comprehensive functionality, such as enhanced throughput and process control. KLA 7700M Surfscan features a high-speed, dual-axis positioning unit, with a 8" x 8" x 0.5" field of view. This enables it to be used for both large-scale wafer testing and for fine-scale analyses of features on the wafer surfaces. The machine also provides high-resolution aberrations and color-grating measurements designed to maximize yield, as well as optical profilers and a particle counting mode capable of detecting particles down to 1μm. TENCOR 7700M Surfscan's advanced scanning tool is designed to support variable wafer sizes and curvatures, up to an 8-inch diameter. In addition, it can be used to inspect any sample with a smooth surface, including flat, coated or etched surfaces, as well as non-uniform surfaces or objects with a varying shape, such as fired circuit boards or plastic products. 7700M Surfscan's sample alignment feature allows for easy, accurate positioning of samples in the asset. This is possible through automatic alignment of the sample in relation to the camera and viewing jets, typically for measurements smaller than 1mm. In addition, KLA / TENCOR 7700M Surfscan features a number of software features for wafer inspection. It is capable of obtaining a wide range of measurement results, with customizable data display options and support for advanced data analysis. Furthermore, the model offers robust data logging and reporting capabilities to enable easy and secure storage of the results. Overall, KLA 7700M Surfscan provides a comprehensive set of features for wafer testing and metrology, designed to maximize yield and improve process control. Its automated equipment handles various wafer sizes and materials, while providing advanced measurement capabilities and software features for manual or automated operation. The system is capable of obtaining a range of data to enable comprehensive analysis and report generation for increased process control.