Used KLA / TENCOR 7700M Surfscan #293603718 for sale

KLA / TENCOR 7700M Surfscan
ID: 293603718
Inspection systems.
KLA / TENCOR 7700M Surfscan is a wafer surface testing and metrology equipment designed to optimize precision, accuracy, and throughput in a production setting. It can detect material properties on a wide range of wafer surfaces, including dielectric surfaces, metals, leadframes, and wafers with embedded structures. At the core of the system is a high-resolution digital microscopy subsystem that captures surface images at magnifications up to 1800x, allowing for detailed analysis of the most complex of surfaces. The unit can automatedly perform full-field topography scanning and identify parametric cross-sectional features on the most intricate of features. To ensure high precision, KLA uses proprietary mapping technologies such as the Kernaisk- Sondermann Mapping Method to map nanoscale features. The scans capture roughness, contours, step heights, and line widths, enabling detailed analysis of a wafer surface. The machine can even identify the presence of a pad opening or bumps on the wafers. The acquired images are then delivered in 1nm repeatable raster scans and overlayed images in the scan kitchen, allowing process engineers to identify repeatable process-induced defects and conduct parametric metrology and production yield assessment. The tool also features contact, non-contact, and non-destructive testing capabilities, including AC and DC testing, capacitance-voltage measurements, wafer resistance testing, isolation characterization, and DC parameter extraction. During these tests, the asset's 16bit digital photography and specialized investigation software can detect wafer flaws and predict the effects of process changes on wafer surfaces and properties. KLA 7700M Surfscan model is the ideal tool for characterizing and optimizing critical processes That demand high-precision, repeatable, and scalable analysis. The equipment offers state-of-the-art capabilities, Accurate, repeatable processes, and insightful analytics to drive efficient and reliable process designs.
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