Used KLA / TENCOR 7700M Surfscan #293626887 for sale

KLA / TENCOR 7700M Surfscan is an advanced wafer testing and metrology equipment for semiconductor manufacturing. This system utilizes a short-wavelength scanning projection microscope with a CCD camera to measure the profile of a device surface with sub-nanometer accuracy. The unit provides high-speed imaging of wafer topographies at various magnifications and high-resolution imaging of extremely small structures. It is capable of feature detection, image stitching, and complex overlay measurements for precise alignment. KLA 7700M Surfscan offers the user an intuitive graphical user interface platform featuring a wide array of advanced capabilities. It allows for the ability to easily adjust view and measurement settings, monitor progress, and review acquired data by plotting charts, images, and tables. The 7700M also features a multitude of metrology technology enhancements, such as Focus-Tilt Correction, Auto-Align Machine, and Multi-Spectral Imaging, to ensure top quality results. TENCOR 7700M Surfscan is capable of measuring feature sizes and identifications, as well as flatness, surface roughness, and contour roughness analyses. Furthermore, it is highly precise and precise in edge detection and alignment, making it the perfect choice for precise metrology applications. The tool is also extremely versatile, offering users the ability to connect multiple systems to create a fully automated wafer handling asset. This single automated model can test and measure multiple wafers simultaneously to vastly increase throughput. 7700M Surfscan equipment provides a complete toolset for analysis and statistical process control, with measurements for both online and offline use including production-grade power characterization, local thickness uniformity, and fast die-sort scoring. KLA / TENCOR 7700M Surfscan is an advanced wafer testing and metrology system that offers the user extreme precision and state-of-the-art analysis capabilities. It is capable of fast imaging, high-resolution feature detection, edge detection, and complex overlay measurements, making it the perfect choice for top quality precision applications. The user can connect multiple systems to create a fully automated wafer handling unit, enabling increased throughput and full statistical process control. All in all, KLA 7700M Surfscan serves as an invaluable tool for any semiconductor manufacturing facility.