Used KLA / TENCOR 7700M Surfscan #293627336 for sale

KLA / TENCOR 7700M Surfscan is a wafer testing and metrology equipment designed to support the testing of high volume, high complexity, and high speed production of integrated circuits. The system provides a full suite of automated measurements, including edge tester and reticle tester, image inspection, electrical test, and non-optical inspection. KLA 7700M Surfscan is designed to perform a wide variety of measurements across multiple wafer layers with superior accuracy. The unit features a high speed integrated reticle tester to inspect patterns on the various layers of a wafer. The reticle tester is capable of detecting defects as small as 5nm in size. The precise measurements made by the tester can provide critical data to characterize device structures and optimize process conditions. The machine also provides an optimized edge tester for precise measurements along the wafer edge. The edge tester can detect surface imperfections and measure parameters such as edge profile and surface flatness. In addition to automated measurements, TENCOR 7700M Surfscan tool also provides image inspection. The image inspection module provides non-contact images of the wafer surface at multiple magnifications and is capable of detecting micro-particles, scratches, and contamination. The accuracy of the asset is further enhanced with advanced imaging algorithms and automated focusing. Additionally, the model provides electrical test capabilities to evaluate device-to-device life-time reliability, current leakage, and electrical properties of the device. Once completed, detailed data analysis is provided to allow engineers to develop better processes. Overall, 7700M Surfscan is a state-of-the-art wafer testing and metrology equipment designed to provide leading-edge device tests, inspection, and analysis for the production of complex and advanced integrated circuits. The system provides a comprehensive suite of automated measurements, image inspection and analysis, and electrical test capabilities to help ensure the accuracy and quality of wafer production. With its robust design and high accuracy measurements, KLA / TENCOR 7700M Surfscan offers an efficient, flexible, and reliable solution for today's IC fabrication needs.