Used KLA / TENCOR 7700M Surfscan #9383420 for sale

KLA / TENCOR 7700M Surfscan is a highly advanced wafer testing and metrology equipment designed for use in the semiconductor industry. It is a fully automated programmable metrology system for measuring electrical and physical properties of individual die and dice in wafer form. KLA 7700M Surfscan features a highly precise optical metrology unit which is capable of detecting defects as small as 0.2 microns in size, ensuring that the wafers are defect free before they are sent for manufacturing. The machine also features a high-performance Optical Studio application, which provides full characterization of every die on the wafer. The tool utilizes a large range of technologies, including high-power laser imaging, 3D microscopy, and optical diffraction. The asset is also highly efficient, with the capability to process thousands of wafers in a single day. Additionally, the model also features advanced analytical software which allows for detailed characterization of die characteristics such as critical dimention, defect density, overlay, and etch. This data is then used to identify potential yield improvement opportunities. Other key features of TENCOR 7700M Surfscan include an ergonomic design, support for industry-standard communications protocols, and a powerful integrated data acquisition equipment. This ensures that the system can handle complex test requirements with ease. Overall, 7700M Surfscan is an advanced and efficient wafer testing and metrology unit designed for the semiconductor industry. With its powerful optical metrology machine, integrated data acquisition tool, and analytical software, it is able to quickly identify defects in wafers and ensure that the wafers are defect free before they are sent for manufacturing.