Used KLA / TENCOR 8450 #9316169 for sale

ID: 9316169
Critical Dimension Scanning Electron Microscope (CD-SEM).
KLA / TENCOR 8450 is a wafer testing and metrology equipment that offers the highest levels of accuracy and quality in the measurement and analysis of semiconductor devices and materials. This system offers best-in-class performance for production and quality control in a wide range of critical metrology applications. KLA 8450's advanced technology is designed to meet the rigorous demands of high production yields, improved reliability and business intelligence in this critical area of microelectronics. It enables wafer level analysis, from wafer geometries to feature sizes, surface textures, and film thicknesses, as well as energy distributions of light and other physical analyses. TENCOR 8450 incorporates advanced capabilities that allow for precise, consistent and controlled repeatable measurements that can be used across a wide variety of applications. The unit's high-end optical surface imaging technology enables precise pattern recognition and dimensional measurement at the nanometer scale level. Additionally, 8450 provides multiple technologies for contour measurement, thickness measurement, imaging, critical-dimension metrology, 3D analysis and more. The solution also comes with a suite of wafer inspection software that enables flexibility and quick setup for varying customer requirements. KLA / TENCOR 8450 offers a turnkey machine solution that maximizes uptime and is easy to integrate into any laboratory and production environment. Its features include high accuracy, repeatability and stability, robust industry-leading sensors, user-defined test parameters, reliable wafer automation solutions, and excellent customer support. Overall, KLA 8450 makes wafer testing and metrology straightforward, accurate, and efficient. It offers the highest quality in the testing and analysis of critical semiconductor materials, enabling users to consistently produce reliable and high-yielding results.
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