Used KLA / TENCOR 8450 #9316171 for sale

KLA / TENCOR 8450 Wafer Testing and Metrology Equipment is a versatile, automated platform designed for testing and metrology applications for advanced semiconductor devices. The system is capable of identifying and characterizing even the most complex defects on the wafer surface. It features a wide range of non-contact, capacitive measurement techniques and powerful scanning capabilities. KLA 8450 unit features highly precise, automated vision and light metrology capabilities. It is built with an advanced imaging machine using bright field and dark field techniques to identify surface TOP atoms dopant placement and complex defects, and can also measure the atomic height and size of structure features. The tool is capable of inspecting complex patterned microcircuits in the nanometer range. It produces detailed 3D visualizations, which are then used to analyze overlay and profile registration information. The asset features an integrated Data Acquisition Model (DAS) which is optimized for high-speed data capture and analysis. The DAS provides fast, accurate results, and can store large amounts of data for extended test periods. For a complete equipment solution, the system is offered with an optional NanoMeasurement Unit (NMS). The NMS provides advanced nanoscale metrology for precise measurements of nanostructures, allowing for dimensional characteristics to be measured. TENCOR 8450 machine offers the highest level of accuracy, reliability, and performance. It is a robust, scalable solution which allows for flexibility and adaptation in a wide variety of advanced semiconductor devices. With its cutting-edge technology, 8450 provides an effective solution for testing and metrology applications in semiconductor technology.