Used KLA / TENCOR 9000 Surfscan #293621532 for sale

KLA / TENCOR 9000 Surfscan is a state-of-the-art wafer testing and metrology equipment designed to assess the critical characteristics of a wide range of semiconductor devices. The Surfscan system offers powerful automated defect detection capabilities, providing fast, reliable and accurate data. The unit features a metrology control center and a powerful optical-based metrology machine, which is capable of measuring features ranging from 0.25 microns to 1 micron. The metrology tool is composed of a laser scanning asset with a digital camera and a 12-bit digital optical signal processor. This combination allows the model to capture and accurately measure the size and shape of various defects, as well as identify the defect type. The Surfscan equipment is equipped with a variety of automated defect detection techniques. These include spatial correlation, dynamic range correlation, and pattern recognition techniques. The system has advanced imaging capabilities, including wavelength-dependent imaging and super-resolution imaging. This allows for the examination of higher-level features, such as contact holes and mini-grids. The Surfscan unit also has built-in data visualization capabilities, allowing the user to quickly identify, interpret and analyze any potential defects. The user interface is highly intuitive, allowing operators to quickly and easily understand the results of their inspections. Additionally, the machine's software is designed to extract and interpret the data obtained from the metrology tool, making it easy to draw meaningful conclusions from the results. KLA 9000 Surfscan is an efficient and reliable tool for examining and testing semiconductor devices. Its advanced metrology capabilities, and its suite of automated defect detection techniques enable the asset to accurately and quickly assess the quality and integrity of a range of different devices. This makes it an invaluable tool for those developing, manufacturing and testing these devices.