Used KLA / TENCOR Acrotec 6020 #9292406 for sale
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KLA / TENCOR Acrotec 6020 is an advanced wafer testing and metrology system that is designed to perform high-precision defect inspections and evaluations. With its automated scanning and imaging technology, it offers the highest resolution and accuracy required for modern wafer and substrates manufacturing. Its automated wafer scan system accurately detects, characterises, and records defects ranging from particle size to micro-particles on the surface of a wafer. With its advanced OptiGauge defect detection mode that employs sector sampling, it can detect and analyse various types of protective coatings, including resist and barrier coatings. The user-friendly interface and graphical display, combined with automated statistics and statistical analysis, creates an easy to use environment for statistically controlled measurement and evaluation. KLA Acrotec 6020 features high-precision wafer positioning; rapid response to wafer edge detection sensing; a full-field scanning capability; advanced image interpolation capabilities to optimize image quality; and advanced imaging algorithms for high-precision defect detection and analysis. Its wafer alignment and trimming capabilities, designed to meet the highest resolution requirements of the industry, ensure optimal positioning and precision alignment of the wafer for uniform measurements. TENCOR 6020 is powered by the latest in wafer metrology and inspection technology. It is equipped with several automated imaging modes, including a focus scan mode for 3D imaging of the wafers, a defect scan mode and a monitor scan mode. The focus monitor scan takes images in a helicoidal orientation, providing a 360-degree view of the surface. The image analysis module of Acrotec 6020 includes a variety of measurement, classification, and analysis functions that allow users to easily find and evaluate defect centers. TENCOR Acrotec 6020 is backed by a comprehensive suite of wafer testing and metrology software including OASIS, PATRIOT, and CORAIS. The OASIS software enables accurate stiction, stress, and contamination test results, while the PATRIOT application offers statistical process control for high-precision wafer measurements. The CORAIS module supports multi-layer imaging and stress mapping, offering reliable defect recognition and reporting. The versatile and cost-effective KLA 6020 wafer testing and metrology system provides the highest levels of wafer defect inspection and evaluation efficiency and accuracy. With its automated scanning and imaging technology, it offers the most thorough and precise wafer inspection and analysis available in the market.
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