Used KLA / TENCOR Acrotec 6020 #9299334 for sale

KLA / TENCOR Acrotec 6020 wafer testing and metrology equipment utilizes optical techniques and advanced algorithms to provide highly accurate, high-bandwidth characterization and analysis of wafers on test, radiation-hardened, and high-performance semiconductor materials. This system provides an abrasive, efficient approach to sub-surface analysis of wafers as well as a comprehensive suite of software, hardware, and measurement tools that allow for detailed, convenient, and repeatable metrology measurements and data analysis. KLA Acrotec 6020 features a large field of view, with high lateral and vertical resolution, and it provides a wide range of motion to measure a large variety of wafer edge shapes. It contains optical zoom and automatic focus, as well as advanced image procession technology which allow for accurate and repeatable measurements. It also features a two-dimensional laser displacement sensor for advanced planarity and critical dimension (CD) measurements. The unit combines a high-speed, multi-angle imaging machine with a powerful 3-axis scanning head that can traverse over 7 cm2 per motion, allowing for high sampling rates. It is also capable of producing up to two gigabytes of uncompressed image data per measurement, offering greatly improved accuracy and repeatability. Additionally, TENCOR 6020 is equipped with a powerful, intuitive labeling and annotation toolkit that enables users to quickly identify and annotate features on wafers for data comparisons. It also allows for automatic feature comparison over multiple large groups of wafers, and can be connected to networked computers to transfer results or utilize off-site analysis. Metrology engineers, researchers, and technicians can utilize Acrotec 6020 to measure, characterize, and analyze a variety of wafers and radiation-hardened materials. Its accurate and repeatable measurements, combined with its intuitive labeling and annotation capabilities, make it an invaluable tool in wafer testing and metrology laboratories. With KLA / TENCOR 6020, advanced, efficient analysis of wafers is now easier and more accessible than ever before.