Used KLA / TENCOR ADE 9500 #293662989 for sale

KLA / TENCOR ADE 9500 is a wafer testing and metrology equipment designed to provide precise measurements in wafer process analysis. It is an innovative, cost-effective solution for monitoring and controlling critical process parameters. KLA ADE 9500 operates as a scanning electron microscope-based metrology system, using backscattered electron images to measure the characteristics and profile of substrates, patterned materials, and dielectric layers. It takes advantage of 3D imaging to deliver enhanced surface topography analysis and precise metrology for continuous monitoring of the wafer processing. TENCOR ADE 9500 features an automated multi-beam column that enables precise measurement of multiple sites across large wafers at high-speed. The unit is equipped with the latest scanning electron microscope technologies, such as Low Vacuum Imaging (LVI) and sub-micron resolution. This technology helps to generate high-resolution secondary electron images, which facilitate detailed analysis of the wafers. The machine also incorporates advanced algorithms and optics, allowing it to accurately detect defects, such as voids, scratches, and scratches in depositing, etch, and deposition systems. The automated measurements deliver quick and reliable wafer testing and metrology data, which helps production line engineers and process engineers optimize their production process. The tool operates with an intuitive user interface with easy-to-follow graphical displays. ADE 9500 is designed to provide reliable and repeatable measurements, fast throughput, and automatic sizing. Since the asset supports a wide range of sample types, such as semiconductor wafers, glass wafers, non-square wafers, and circuit board substrates, it can be used for a variety of applications, both in research and in industrial settings. KLA / TENCOR ADE 9500 is an incredibly versatile and efficient model for wafer process analysis, providing the flexibility and accuracy necessary for efficient detection and analysis of wafers. It is a powerful tool for wafer yield optimization and cost reduction.