Used KLA / TENCOR ADE 9500 #9169420 for sale
Ultra gauge multi-measurement system Includes: ASC 1000 Controller Dual cassette E-Station.
KLA / TENCOR ADE 9500 is a wafer testing and metrology equipment that enables advanced defect detection and analysis. The system incorporates multiple technologies to inspect and characterize defects on a variety of substrates, including photomasks, wafers, and flat panel displays. KLA ADE 9500 unit utilizes a combination of advanced optics, hardware, and software to allow precise measurement of feature sizes, line widths, and defect size and location. It is powered by the KLATrimaxTM Imaging Machine, giving it the ability to provide high-resolution images of features down to 10 nanometers. Additionally, an optical reflectometer is used to precisely measure the reflectivity of various materials. A customized pattern recognition tool provides automated recognition of defect types and signals at various stages of the inspection process. TENCOR ADE 9500 asset is designed to identify and analyze defects in even the most challenging and demanding integrated circuit designs. It is capable of detecting and measuring defects with surface topography heights ranging from 10 to 4,000 Angstroms. Since these signals are closely related to process yield, ADE 9500 model enables enhanced process control and yield optimization. KLA / TENCOR ADE 9500 equipment is easy to use and can be quickly set up for specific applications. It also offers various automation levels, from semi-automation with manual substrate loading and unloading to fully automated in-situ systems. The system also integrates with Metrology Manager software package, which enables engineers to review the wafer surface and analyze defect data through real-time SPC software. This feature allows engineers to quickly evaluate a variety of defect signals, providing actionable information to help optimize manufacturing processes and improve yields. KLA ADE 9500 unit is a comprehensive, high-performance, user-friendly tool providing precise defect detection, analysis, and process control. It is ideally suited for semi-conductor ICs and flat panel displays, and provides engineers with the information they need to identify process issues, reduce inspection times, and improve overall yield.
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