Used KLA / TENCOR ADE 9500 #9389842 for sale

KLA / TENCOR ADE 9500 wafer testing and metrology equipment is a leading edge process control solution designed to provide precise, reliable, and accurate measurements for semiconductor wafer production. The system offers a combination of automated software, hardware, and measurement capabilities, helping manufacturers achieve improved yield through real-time process optimization. KLA ADE 9500 unit consists of several components, including the automated measurement station (AMS), the scanning electron microscope (SEM), the pattern recognition machine (PRS), the automated defect analysis (ADA), the defect review tool (DRS), and the mass data controller (MDC). The AMS is an automated, real-time testing and metrology station that measures the electrical and physical properties of wafers with high accuracy. The SEM is a high resolution imaging asset that can detect, characterize, and identify defects on the surface of a wafer. The PRS is designed to detect and characterize patterns of defects in a wafer. This allows manufacturers to optimize process recipes to reduce defectivity. The ADA allows for rapid identification of isolated defects that are difficult to detect with the SEM. The DRS is a software tool that provides a user-friendly interface for reviewing images and data from multiple sources. The Mass Data Controller (MDC) is a feature-rich software application that integrates all model components for effective data collection. The MDC allows for gating, measurement and defect review of product and other data from throughout the full production line. The MDC stores and processes data, cooperating fully with existing technologies to create an end-to-end process solution. With TENCOR ADE 9500 equipment, operators can quickly address defects in real-time, driving process efficiency and improved yield through the entire production cycle. ADE 9500 also incorporates traceability and secure data archiving capabilities, ensuring strict adherence to industry standards. As a result, users benefit from increased process reliability and improved fab throughput.