Used KLA / TENCOR AIT 1 #182433 for sale
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KLA / TENCOR AIT 1 is a leading-edge wafer testing and metrology equipment designed to efficiently and effectively measure, analyze and assess a broad range of parameters on semiconductor wafers. It provides real-time feedback so operators can optimize process parameters and assess process results at each step of production. To facilitate wafer testing, KLA AIT 1 utilizes KLA patented OptoScribe™ technology. This patented optical system ensures optimal measurement accuracy, with the ability to inspect wafer surfaces and structures on the nanometer scale. It can also measure a wide range of defect sizes from 20-40 μm down to a few nanometers. TENCOR AIT 1 offers a unique suite of optical and acoustic sensing capabilities, helping to ensure the reliability and precision of wafer testing. For instance, the unit is capable of highly accurate angular measurements. It also has the capability to detect and assess defects in low-power imaging and in-situ topography mapping. AIT 1 accommodates a wide variety of wafer sizes and configurations, including advanced 2D and 3D wafers. It also offers an automated defect classification (ADC) machine which enables efficient separation of meaningful results from background noise. The tool is also equipped with advanced software tools that facilitate real-time analysis of test data, as well as detailed report generation. Moreover, it has exclusive traceability capabilities which allow operators to quickly track and document steps in the test process quickly and accurately. This helps to ensure process repeatability and quality control. In terms of its hardware capabilities, KLA / TENCOR AIT 1 offers a wide range of options. These include a programmable motion table for wafer localization and scan alignment, a high-contrast BGA inspection head, and auto-sensing feedback modules. All of the software and hardware components work together to guarantee the accuracy, precision and quality of results from KLA AIT 1 asset. Overall, TENCOR AIT 1 is an essential tool for semiconductor manufacturers who require efficient, reliable wafer testing and metrology. Its impressive array of features, advanced software and hardware capabilities, and robust traceability model make it a premier choice for quality assurance.
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