Used KLA / TENCOR AIT 1 #9043941 for sale
KLA / TENCOR AIT 1 is a wafer testing and metrology equipment designed for consigned wafer testing and incoming wafer inspection. It is a powerful, versatile and reliable system with fully automated wafer testing capabilities. It can process up to 200 wafers per hour and features a large touch-screen display with interactive menus, real-time results and graphical trend charts. Its configurations are optimized for both process control and yield analysis. It works with wafers up to 200 mm in diameter and thicknesses up to 0.5 mm. It is also equipped with a series of optical and wafer-handling sensors, probes, and measuring assemblies. This unit offers comprehensive measurements such as contact angle, capacitance, traceability and uniformity across the entire wafer. It also includes a specialized metrology machine that accurately measures topography, nodularity, flatness, electrical characteristics, defects and a host of other prevalent features. It can accurately measure down to 1 micron accurate. KLA AIT 1 is powered by a computer running a user-friendly graphical user interface (GUI) for fast wafer loading and setup. This GUI allows operators to enter patterns on wafer maps, set up presets, run tests and analyze data results. Multiple processes can be carried out simultaneously and data can be exported to other systems for further analysis. It also provides a wide array of reporting capabilities including tables, plots, images and log files. The tool also includes advanced wafer testing and extensive online measurement capabilities that help users maximize up-time, thereby reducing their costs. In addition, TENCOR AIT 1 was designed for easy operation, maintenance, and upgrades. Its ergonomic design and rugged construction make it well-suited for rapid deployment in any setting. AIT 1 is an excellent solution for a broad range of tasks in the production line, laboratory and research centers. Its versatility and analytical capabilities make it an ideal choice for wafer testing and metrology.
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