Used KLA / TENCOR AIT 8010 #9206647 for sale

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ID: 9206647
Vintage: 1998
Particle counter 1998 vintage.
KLA / TENCOR AIT 8010 is a high-end wafer testing and metrology equipment from KLA used to identify defects, document product characteristics, and generate data for IC yield improvement. This machine is designed to have superior high performance, enhanced throughput, and minimal to no operator interaction. KLA AIT 8010 is an automated inspection tool using powerful imaging optics, wafer pattern recognition, and powerful software algorithms to deliver exceptional accuracy and repeatability. TENCOR AIT 8010's unique hardware and software features enable it to deliver superior image acquisition and analysis, as well as advanced metrology capability. With high-powered digital imaging technology and up to 255 nanometer pixel resolution, AIT 8010 can accurately measure small features and defects. The Advanced Pattern Recognition allows for the detection of both seams and cracks, and the ability to distinguish between different types of defects. Additionally, the system's advanced high accuracy algorithms make it possible to accurately measure critical substrate parameters including dimensional uniformity, line width, depth of features, and even the presence of dust particles. Moreover, KLA / TENCOR AIT 8010 is capable of measuring highly precise parameters within low tolerances. For example, it can measure line widths with 0.0025 micrometer repeatability and 0.0015 micrometer accuracy. This ensures that the unit can accurately identify and classify small defects such as dust particles, scratches, and voids. KLA AIT 8010 also features a powerful Data Analysis and Report Generation Machine, which provides a comprehensive analysis in both graph and table formats. This tool allows for rapid determination of the cause and source of potential yield loss independently and in conjunction with other types of metrology data. This tool is designed to be an efficient and easy to use asset and includes an easy to use user interface for scientific and non-scientific users alike. The interface allows for single-click operation for most standard tasks and includes multiple setting options and features for customizing the model to each application. Overall, TENCOR AIT 8010 is a powerful and reliable wafer testing and metrology solution that enables users to maximize IC yield. This equipment delivers high performance, accuracy, and repeatability in an easy to use interface. Its advanced optics and algorithms make it an ideal choice for a variety of wafer testing applications.
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