Used KLA / TENCOR AIT II #293585798 for sale

KLA / TENCOR AIT II is an advanced wafer testing and metrology equipment for semiconductor IC manufacturers. The system offers high precision measurements for the characterization of key electrical, optical and geometric device parameters, allowing for the optimization of the development and fabrication process. KLA AIT II offers a variety of platforms for wafer testing and metrology. Its integrated metrology platform uses patented optical technologies to obtain accurate and repeatable measurements of a range of feature sizes, as well as profile and image metrics. This platform collects critical feature information, such as linewidth, space and height measurements of interconnects and contacts, as well as die maps, to support rapid process optimization. The unit also offers the capability to analyze profile and image data in three dimensions, enabling comprehensive understanding of complex device structures. The machine's unique electrical test tool provides measurements of high frequency, digital and analog integrated circuits, as well as a wide range of disciplines and offers a flexible, highspeed testing capability. This asset also provides an interface for a wide range of characterization instruments, from electrical delay line testers to vector network analyzers. TENCOR AIT II also offers complete integrated metrology for inspection and assembly, with a variety of optics for substrate, package and board measurement, inspection and characterization. It provides high precision three-dimensional measurement capabilities for analyzing film thickness and micro-defects, as well as for the inspection of micro-bonded structures. The model also offers a comprehensive data management solution for the efficient collection, storage, retrieval and reporting of measurements. The database can support multiple testing strategies and automatically generate reports for improved business intelligence. AIT II is a powerful solution for non-destructive subsequent wafer testing, offering high precision measurement capabilities equipped with advanced technologies and integrated database solutions, making it ideal for meeting the demands of today's semiconductor manufacturers.