Used KLA / TENCOR AIT II #293595222 for sale
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KLA / TENCOR AIT II is a state-of-the-art automated inline wafer testing and metrology equipment designed for the semiconductor industry. This system supports various wafer types including 205, 300 and 450mm. It offers reliable and accurate measurements on a wide range of parameters including critical dimensions(CD), film thickness, etch depth, oxide thickness and chemical-mechanical planarization(CMP) process monitoring. The unit uses a combination of optical imaging, scatterometry and metrology technologies to accurately measure complex semiconductor structures. The machine is integrated with advanced signal processing algorithms, data-driven pattern-recognition solutions and advanced machine learning. Using these technologies, it quickly provides more accurate and comprehensive data than manual measurements. The tool is also integrated with a comprehensive range of software tools and data analysis tools, providing users with the ability to rapidly evaluate critical process and quality metrics. KLA AIT II also offers precise and reliable high-throughput testing solutions. It has adjustable line-of-sight(LOS) and angle-of-incidence(AOI) capabilities, allowing users to optimize their CD measurements. The asset is also capable of identifying hard-to-discern features and defects on the wafer surface, including particles, debris and discoloration. This helps reduce the risk of misalignments and inaccuracies which can lead to yield losses. With its modular and upgradable architecture, TENCOR AIT II provides an efficient and cost-effective testing solution, from process development to production. It offers remote support capabilities, as well as customizable user-friendly interfaces for easy operation and maintenance. It is also equipped with an extensive range of platforms, including DfX, SPC, Advanced Process Control (APC) and more. AIT II is an innovative and powerful wafer testing and metrology model. It has been designed to offer reliable, accurate and cost-effective solutions to the semiconductor industry. The equipment's advanced signal processing algorithms, data-driven pattern-recognition solutions, and sophisticated machine learning capabilities help to ensure accurate measurements and superior quality control. Additionally, its flexible architecture, customization options and remote support features help provide an efficient and cost-effective testing solution.
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