Used KLA / TENCOR AIT II #9249021 for sale

KLA / TENCOR AIT II
ID: 9249021
Vintage: 2000
Defect inspection system 2000 vintage.
KLA / TENCOR AIT II is a state-of-the-art wafer testing and metrology equipment from KLA Corp., designed for semiconductor manufacturers and research organizations. KLA AIT II integrates multiple sensing platforms, providing on-site wafer testing and metrology with one compact system. This unit provides automated, accurate, and repeatable metrology data for advanced process control, and allows for full semiconductor wafer testing, characterization, and analysis. TENCOR AIT II features a suite of advanced technology, including integrated reticles (for optical alignment and critical edge definition of wafers), multiple imaging systems (including direct and reflected light microscopy, and charge-coupled device cameras), non-contact optical profilometers, automated and accurate sample positioning systems, spectral imaging capability for wafer mapping, and automated wafershandling systems. AIT II offers unparalleled performance with advanced capabilities such as automated testing, real-time visualization, comprehensive data analysis, and integration of multiple imaging systems. The machine has integrated software algorithms that enable comprehensive data processing and analysis, including automated defect detection. The real-time surface metrology capability allows for accurate and repeatable metrology results, enabling faster wafer testing and high-precision qualification. In addition, KLA / TENCOR AIT II features interchangeable imaging and measurement modules, allowing for flexible configuration for different applications. The tool is particularly well-suited for small-scale production requirements or process development initiatives, as well as large-scale industrial Fab operations. KLA AIT II is a powerful wafer testing and metrology asset that enables semiconductor manufacturing to achieve higher precision and quality control, better efficiency, and improved yields. Its advanced technologies provide comprehensive, automated, accurate, and repeatable tests for wafer qualification, enabling high-precision metrology and data-driven process optimization. With its versatile configuration and assured repeatability, TENCOR AIT II offers an ideal solution for industrial and research users alike.
There are no reviews yet