Used KLA / TENCOR AIT II #9284347 for sale

KLA / TENCOR AIT II
ID: 9284347
Defect inspection system.
KLA / TENCOR AIT II (Atomic Information Tools) is an advanced wafer testing and metrology system designed for microelectronics reliability and process control. It automates the testing of complex semiconductor devices, enabling manufacturers to accurately analyze device deterioration and assess short and long-term reliability. KLA AIT II leverages leading-edge optical, electrical and mechanical technologies for online, in-line production monitoring and process control. TENCOR AIT II's optical measurement capabilities include a laser reflectometers to measure surface roughness, a shearography unit to measure shrinkage and warpage in thin films, an infrared imaging system to measure light sources, a critical-dimension station to measure features on the surface of the device, and a scanning electron microscope to analyze the microstructure of the device. AIT II's electrical capabilities include an electrical probe station to measure device characteristics and an impedance meter to measure line resistance, capacitance and inductance of device lines. KLA / TENCOR AIT II's mechanical capabilities include a torsional stage to measure package distortion, a vibrating stage to measure vibration induced stress, and a bending jig to measure die-attach stresses. KLA AIT II's software suite is designed for control, communication, and data collection from electronic components such as non-volatile RAM, EEPROM, Flash, NOR and NAND memory, ROM and ROM buses, microprocessors and other electronic components. It also provides the functionality to be integrated with process control systems in a production setting. It is capable of executing automated test sequences and of providing customized reports. TENCOR AIT II is also able to monitor production processes using statistical process control tools. Its built-in algorithms monitor stored device data over time to detect process drift and variations. Additionally, predictive modeling uses device template data to determine process drift and predict future device performance. This allows engineers to quickly identify out of specification conditions and take corrective action. AIT II is built to support multiple languages and provides secure, traceable data and record keeping. Its user-friendly interface and modular design make the system easy to configure, maintain and troubleshoot. KLA / TENCOR AIT II offers a high degree of accuracy over large sample sets and rapid time to market. KLA AIT II is the ideal choice for high-quality, high-value production process control.
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