Used KLA / TENCOR AIT II #9377284 for sale

KLA / TENCOR AIT II (Advanced Inspection Tool) is a wafer testing and metrology equipment designed to quickly inspect and analyze defects on large wafers. It provides a highly reliable solution for ensuring that wafers are processed correctly and don't contain any defects. KLA AIT II consists of a powerful automated system with an x-ray detector that makes it possible to inspect an entire 300mm wafer in just 15 seconds with ultra-high accuracy. The unit can detect both foreign and native particles, with a sensitivity on par with the most advanced methods used by the semiconductor industry. Using photographic imaging, the machine is able to identify, measure, and analyze defects of even very small size. The tool's software is configurable to inspect up to 20 different types of defects, and can be calibrated to precision levels as low as 1 nanometer. In order to ensure high accuracy, TENCOR AIT II's wafer metrology asset utilizes a combination of standard optical techniques and laser diffraction. This advanced metrology model allows for fast, accurate defect measurements, and is able to detect even the smallest defects. The equipment also features a wide range of features designed to improve accuracy and efficiency. These features include an automated defect detection system, a defect inspection archive, particle contour data, a defect inspection sequence builder, an operator interface, and image post-processing tools. KLA have also developed a range of hardware and software options that allow users to adapt the unit to meet their specific needs. Examples of these options include the addition of a high-resolution microscope, a third-generation collimated detector, and an automatic calibration machine. In addition to its impressive features, AIT II is one of the most user-friendly wafer testing and metrology systems available. It boasts a user-friendly interface and comes with comprehensive documentation to help users quickly and accurately set up and operate their systems. In summary, KLA / TENCOR AIT II is a powerful and reliable wafer testing and metrology tool that can provide a quick, accurate, and cost - effective solution to a wide range of wafer inspection and analysis needs.