Used KLA / TENCOR AIT III #293711267 for sale
URL successfully copied!
Tap to zoom
ID: 293711267
Vintage: 2001
Defect inspection system
Hard Disk Drive (HDD)
PCB Missing.
KLA / TENCOR AIT III is a wafer testing and metrology equipment designed for semiconductor device production. The system allows for a variety of high-accuracy measurements, ranging from on-wafer electrical testing, optical and thermal tests, as well as pinpointing specific defects on a wafer surface. KLA AIT III is highly capable of both facing the high demands of production lines and being able to detect any process-related issue quickly. It can handle wafers up to 200 mm with a throughput of up to several hundred wafers per hour, at full scale testing. The unit is designed to prevent costly rework and quickly identify and quantify any kind of process-related issues. TENCOR AIT III is capable of providing both in-line and off-line testing. It is capable of color imaging, particle count, die-by-die yield analysis, binning, optical and electrical defect searches, wafer uniformity testing, and line edge roughness measurements. It is also capable of testing from wafer-level up to the chip level. AIT III is powered by unique Autofocus software, which allows for rapid device recognition even at the challenging high data rates required for testing in high volume production. It also features a flash programmable DSP machine, which enables comprehensive real-time analysis and process monitoring. For example, the tool can monitor any pattern recognition or yield performance issues during the process. Overall, KLA / TENCOR AIT III is a powerful tool for semiconductor device production. It provides a wealth of precise measurements and can be used both in-line and off-line. Its unique Autofocus software, combined with its powerful DSP asset, make it invaluable for device production and testing.
There are no reviews yet