Used KLA / TENCOR AIT UV #9044473 for sale

ID: 9044473
Darkfield inspection system, 2003 vintage.
KLA / TENCOR AIT UV is a state-of-the-art, revolutionary wafer testing and metrology equipment designed to meet the highest levels of accuracy and precision in the semiconductor industry. It provides a comprehensive suite of capabilities for semiconductor manufacturers to quickly and accurately test and inspect their wafers, leading to improved product quality and reliability. KLA AIT UV features a number of automated and semi-automated processes for testing wafers, including optical and yield inspection, x-ray inspection, digital microscopy, and atomic force microscopy. It has an integrated wafer-handling system to ensure accurate and safe evaluation and testing of all wafers. It is equipped with a high-density, fast-scanning array to enable rapid detection across the entire wafer surface, providing accurate performance data and defect location for a variety of substrates. The integrated inspection software of TENCOR AIT-UV allows for easily configurable workflow automation to optimize inspection speed and accuracy. It also provides users enhanced analytics that can be adjusted for various processes. It has a flexible, modular structure for optimizing the unit to best suit the customer's needs, and its adaptive measuring algorithms make the machine suitable for a variety of applications. In addition, the tool has sophisticated optics to capture in-depth scanning data with unrivalled accuracy. Its advanced optics enable industry-leading 3D visualization, which provides deeper insight into wafer structure and performance. In addition, KLA / TENCOR AIT-UV is temperature-controlled for precision and long-term stability. AIT-UV asset is not only a reliable, accurate, and efficient wafer testing and metrology solution for the semiconductor industry, but its exceptional performance and capability is setting the standard for the industry. It provides a comprehensive, accurate, and reliable solution for manufacturers to quickly and accurately detect wafer defect and ensure the highest quality of products.
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