Used KLA / TENCOR AIT UV #9083786 for sale

KLA / TENCOR AIT UV is an innovative wafer testing and metrology equipment that enables the collection, analysis, and reporting of critical real-time defect data. The system offers advanced automated inspections of semiconductor wafers and is ideal for the detection and measurement of micro-structures. KLA AIT UV is a powerful machine that combines wafer testing, metrology, inline control, and defect measurement into a single unit. It uses advanced optical and scanning technologies to check and measure wafer surfaces. Its automated machine delivers fast, reliable measurements with high accuracy, and can inspect individual films, films composed of multiple layers, and patterned wafer surfaces. The tool's unique optical scanning technology and automated defect recognition and selection capabilities enable the detection and measurement of defects with size, shape, and location information. This information can then be used to monitor the progress of wafers in production in order to maximize yield. In addition, TENCOR AIT-UV includes software that enables the user to customize the asset's measurement processes. This software facilitates the selection of parameters for the inspection and measurement of defects, and allows for easy comparison of past and present wafer information and data. KLA / TENCOR AIT-UV also comes with a comprehensive set of reporting capabilities. This includes detailed analysis of inspection and metrology results, as well as a broad set of reporting formats to allow the end user to deliver the information they need, when they need it. Overall, TENCOR AIT UV is an advanced wafer testing and metrology model that offers a combination of optically advanced scanning and automated defect recognition. It provides high accuracy and reliable measurements to achieve maximum yield in semiconductor wafer production. Additionally, the equipment includes customized software and reporting capabilities for the user's convenience.