Used KLA / TENCOR AIT UV #9228297 for sale

KLA / TENCOR AIT UV is a wafer testing and metrology equipment designed to provide high-precision and accurate testing and measurements of micro-structures and advanced material properties within semi-conductor devices. The system works by scanning a wafer in a vacuum environment with a powerful ultraviolet (UV) light source and measuring the absorption of light by the materials. The scanning is done in an ultrafast manner using fast, spurts of the UV light beam, precisely-positioned and generated by different laser sources varied over time. An array of detectors then acquire specific measurements from the scanned wafer in order to evaluate the quality, complexity and features of the materials. KLA AIT UV systems are highly configurable and allow for a wide range of laboratory and process applications. This includes the ability to create powerful advanced metrology processes with a range of features such as defect inspection, yield analysis, 3D yield maps, overlay, webbing and in-die electrical testing. The unit can also be coupled with a variety of optical components such as lenses, refractors and beam-splitter cubes to acquire custom measurements. TENCOR AIT-UV is also designed with noise and stability in mind, featuring AIT (Advanced Image Test) technology which allows for scanning of materials in noiseless conditions. This is achieved through advanced signal analysis techniques and the separation of noise from useful signals. This allows for improved accuracy of measurements and better data results. In order to provide users with the highest levels of sample stability and testing accuracy, TENCOR AIT UV has a low thermal drift feature which helps maintain consistent material conditioning even over long run times. Additionally, it utilizes modern data acquisition and digitization techniques to acquire accurate, high-resolution data from materials of different sizes. AIT-UV machine has an intuitive user interface which allows for easy operation and control of the device. It is designed with automated control tool that can accurately modify parameters as needed while it is running and also provides a range of data output options. Additionally, it features real-time performance displays to monitor testing progress with graded reports and graphical representation. All these features make KLA / TENCOR AIT-UV a powerful and reliable wafer testing and metrology solution for semi-conductor devices and materials. It provides users with comprehensive measurement capabilities in terms of accuracy, speed, flexibility, and suitability for a wide range of applications.