Used KLA / TENCOR AIT UV #9285845 for sale

KLA / TENCOR AIT UV is a wafer testing and metrology equipment capable of advanced dimension and defect inspections of semiconductor wafers. It accurately and accurately measures the width, length, shape, and other characteristics of structures on a semiconductor wafer to detect very small defects or irregularities. It is equipped with a unique ultraviolet (UV) light source that provides high-contrast imaging. This system detects very small defects as low as 0.5 micrometers and can measure features down to 10 nanometers. KLA AIT UV unit is fully automated and able to measure both planar and 3-D structures on the wafer. It offers superior resolution, sensitivity and speed, and features such as auto-focus on the wafer surface, memory functions for faster measurements, and simultaneous sample scan and metrology. Its advanced microscopy platform is based on KLA platform-independent optics, enabling measurement of various features on the surface of the wafer at the same time. TENCOR AIT-UV is also designed to support a wide range of wafer types and sizes. It can be configured with multiple lasers, detectors, cameras, and light sources to meet the specific needs of each application. It also comes with an advanced UV window for fast and accurate wafer measurements, and an intuitive user interface that allows quick switching between applications. The machine is also capable of image analysis, data verification, and defect identification. AIT-UV is also equipped with advanced metrology tools that can capture a wide range of data, including 3-D topography for accurate defect testing and 3-D imaging. It has the ability to examine multiple features of a wafer simultaneously while providing high speed, high accuracy, and repeatability. The tool is also capable of detecting a wide range of defects, ranging from small anomalies to macro-level defects, enabling effective fault isolation and wafer repair. Overall, KLA / TENCOR AIT-UV is an advanced wafer testing and metrology asset. It offers state-of-the-art accuracy and sensitivity for defect inspection and feature measurement, and is designed to support a variety of wafer types and sizes. Its features include a unique UV light source, advanced microscopy platform, image analysis, data verification, and defect identification. AIT UV is a reliable, efficient, and versatile model that provides superior cost advantage compared with other similar tools.