Used KLA / TENCOR AIT UV #9378720 for sale

KLA / TENCOR AIT UV
ID: 9378720
Darkfield inspection system.
KLA / TENCOR AIT UV is a leading wafer testing and metrology equipment, designed to accurately measure a range of parameters related to the structural characteristics of today's advanced semiconductor devices. With its patented technology, KLA AIT UV offers faster and more precise results for device development, fabrication, and reliability assessment. TENCOR AIT-UV incorporates high resolution imaging, enhanced accuracy, and a host of automation features that give users highly reliable data faster than ever before. The system's state-of-the-art imaging and analysis capabilities make for an efficient and accurate wafer testing process. Its powerful optical nanolithography systems provide ultra-high accuracy on-wafer measurements, and a unique Beam Interference Meter (BIM) provides superior 3D topography measurements. The unit's advanced automation features enable high-throughput testing. KLA AIT-UV's Auto Pattern Recognition (APR) recognizes test patterns, automatically assigns the appropriate measurement parameters, and stores the detailed results in its secure database. Its Quality Assurance (QA) suite, VistaQA, is designed to analyze the accuracy of the test data and report any errors or areas of concern. AIT UV also offers a suite of powerful data post-processing software. Its DatapackerMax software is designed to quickly and accurately extract detailed characteristics from the raw data, while its ReviewMax suite provides the power and flexibility to create detailed reports and graphical presentations. Additionally, the machine's Datawave software offers a variety of data analysis and modeling capabilities. TENCOR AIT UV's integrated hardware and software technologies provide an unparalleled level of accuracy and performance in wafer testing and metrology operations. With its easy-to-use interface, automated workflow and powerful post-processing capabilities, its users can trust for reliable, efficient, and cost-effective results.
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