Used KLA / TENCOR AIT UV #9397714 for sale

KLA / TENCOR AIT UV is a state-of-the-art wafer testing and metrology equipment designed for IC manufacturers, foundries and researchers. It combines metrology, defect inspection and characterization capabilities into a single platform to provide faster, higher-powered analysis. KLA AIT UV system can inspect, measure and characterize electrical, physical and visual features of wafer substrates with a single, low-cost platform. This helps keep the cost of materials used in the fabrication of ICs to a minimum. The unit has an integrated, powerful UV light source to detect defects and irregularities on the wafer material and provides an active signal path for feedback to the operator. The machine's active signal path allows the user to analyze the wafer while controlling the tool's power settings, gain, polarizer and neutral density filter settings, and other settings. Adjustment settings are optimized prior to use according to the specific job. TENCOR AIT-UV asset offers static and dynamic metrology capabilities, enabling both immediate and long-term measurements. It also offers non-contact thickness measurement on various dielectric and conductor layers, enabling accurate film thickness profiling even for challenging die topography. The model can detect non-intrusive defects such as particles and slope steps, and its automated defect review, classification and characterization capabilities allow users to quickly and accurately identify, flag and classify any irregularities. KLA / TENCOR AIT-UV wafer testing and metrology equipment shows excellent reproducibility and stability over time, even in challenging environments, due to its advanced internal design and components. Overall, AIT UV is an advanced, automated and user-friendly platform that provides an efficient, cost-effective and repeatable way to test and inspect wafers before fabricating ICs and other components. It can save time, money and resources for manufacturers and researchers, making it an ideal choice for wafer testing and metrology.