Used KLA / TENCOR AIT XP #293610165 for sale

KLA / TENCOR AIT XP is a wafer testing and metrology equipment that is used to analyze various features on a semiconductor wafer. It allows for high-resolution imaging of the surface of a wafer as well as precise measurements of various features of the wafer. The system provides a fully integrated solution to be used in both manual and automated production environments. The unit has a wide range of features which provide high levels of accuracy and precision in wafer testing and metrology. This includes advanced 3D non-contact sensing and precise high-speed autofocus technology to achieve precise imaging even in deep layers of the wafer. The machine also uses advanced high-accuracy scanning and image recognition capabilities to identify and analyze various defects on the wafer surface. The operator also has the option of using manual commands to control the tool, allowing for greater flexibility. The asset also utilizes powerful software-based control and analysis tools for evaluating the results of the measurements obtained from the model. This includes software tools for data interpretation, statistical analysis, multi-sensor correlation, and defect analysis. This feature allows for automated real-time feedback from the equipment to the operator. The system also utilizes a modular design and is highly upgradeable to allow adaptation to various customer needs and changing production requirements. The unit can be used to perform both manual and semi-automated processes and includes various components such as a PC, controller, firmware and software, electrical cabinet and sensors. The machine also offers many benefits to the users, such as higher throughput, increased process productivity, greater data accuracy, and improved diagnostic and Yield Enhancement control. All of these features make KLA AIT XP a unique and powerful tool for wafer testing and metrology.