Used KLA / TENCOR AIT XP #9230562 for sale

KLA / TENCOR AIT XP is an automated wafer testing and metrology equipment that offers solutions for both defect management and process control. The system combines advanced analytics, integrated algorithms, and high-precision measurement capabilities to provide the user with detailed data on the physical characteristics of the wafer, including, but not limited to, surface topography and geometry, wafer thickness, grain structure, wear properties, and optical characterization. KLA AIT XP enables high-throughput testing and metrology of semiconductor materials, components, and devices with great accuracy and repeatability. The unit has multiple sensors, including optical, laser scatter, x-ray fluorescence, acoustic, eddy current, and eddy current optical probes. These sensors provide full-field feedback to the user and enable them to inspect areas of the wafer that are outside the machine's field of view. The machine also features a computer vision machine for automated defect analysis to detect patterns, concentrations, and single defects over a wide range of test parameters. The tool's advanced logic algorithm enables measurement of numerous physical and electrical characteristics of the wafer within seconds and provides data that can be used to identify trends and predict circuit performance. Through integrated design rules, the user is able to develop customized recipes for process control and yields analysis. The machine also offers various reporting tools for easier data analysis, as well as a library of applications for real-time performance monitoring and wafer-level quality control. The asset is designed to operate with minimal maintenance and its intuitive controls ensure that any user can be quickly trained and up to speed with the model. TENCOR AIT-XP is equipped with a powerful software platform, which provides the user with real-time data acquisition, data analysis, and multiple communication options to better understand and manage the entire process. To summarize, KLA AIT-XP is an automated wafer testing and metrology equipment that offers the most advanced tools for quality control and process analysis. The system combines powerful sensors and algorithms with an integrated software platform to provide users with detailed data and performance metrics. The intuitive control unit ensures minimal maintenance, fast operation, and easy training. With AIT XP, users can easily identify defects, inspect areas outside their field of view, and perform process control with high accuracy and repeatability.