Used KLA / TENCOR AIT XP+ #9255307 for sale

KLA / TENCOR AIT XP+ is a highly advanced wafer testing and metrology equipment designed for current and future semiconductor wafer technologies, such as FinFET and other advanced nodes. It is the latest generation of this series of ultra-precision measurement tools from KLA, and offers a host of features and capabilities to help customers take wafer characterization and process control to the next level. KLA AIT XP+ is an automated wafer test and measurement system capable of delivering high-accuracy measurements with unprecedented speed and accuracy. The unit uses sophisticated laser interferometer-based technology to measure individual nanoscale features with a few angstroms of resolution, far surpassing the traditional optical profilers used in many labs. In addition, the machine can perform a number of other testing and metrology tasks, such as thickness metrology, line width measurements, film stress measurements, and topographical imaging. TENCOR AIT-XP+ also provides several advanced features, enabling customers to gain deeper insight into their wafer characterization, process control, and reliability processes. For example, the tool includes a solid immersion lens (SIL) module to enable precision measurements of high-aspect ratio structures such as finFETs. Additionally, the asset offers a broad range of advanced data analysis techniques to help customers optimize their process performance. AIT-XP+ also provides outstanding accuracy, precision and repeatability on a wide variety of substrates and for a variety of applications, making it one of the most versatile wafer testing and metrology systems available. Its innovative design and cutting-edge technology also makes it ideal for extreme accuracy processing in environments where time-to-market and reliability are critical. In conclusion, AIT XP+ is an exceptional wafer testing and metrology model designed for next-generation semiconductor wafer technologies. It offers industry-leading accuracy, precision and repeatability, as well as a host of advanced features and capabilities. Furthermore, its innovative design and cutting-edge technology are ideal for extremely precise and fast processing, making it one of the most valuable tools available for advanced semiconductor research and development.