Used KLA / TENCOR AIT XUV #9240637 for sale

KLA® KLA / TENCOR AIT XUV™ is a robust, high-performance wafer testing and metrology equipment designed for the semiconductor industry. It uses extreme ultraviolet (XUV) source technology to inspect and measure the physical, mechanical and electrical characteristics of wafers, providing high resolution imaging, fast wafer mapping, and accurate wafer analysis. KLA AIT XUV system operates with a state-of-the art XUV light source, providing unprecedented detail and resolution down to 4nm - enabling ground-breaking screening and analysis accuracy. The unit features a high-power pulsed XUV laser, combined with advanced imaging optics and a digital image analysis platform, to deliver superior imaging capabilities and data collection. The machine supports fast wafer mapping and analysis, providing wafer profile and defect analysis over hundreds of wafers in one hour. The feature-rich tool offers automated non-contact inspection, allowing for a complete mapping of the wafer surface. TENCOR AIT-XUV platform provides superior wafer measurement accuracy and repeatability with its nanometer scale metrology capabilities. This includes parameters such as overlay accuracy, particle size and surface roughness measurements, as well as critical feature measurement, all performed without contacting or handling the wafer. TENCOR AIT XUV asset is also capable of complex defect analysis. It uses its advanced imaging technology to capture detailed images of defects and quickly determine their size, shape, and location. Combined with its versatile sample handling model, AIT XUV provides a versatile platform with superior defect analysis capabilities. No other wafer testing and metrology equipment can offer the same level of imaging detail, analysis speed, and accuracy, as KLA / TENCOR AIT-XUV. This robust and reliable system is designed to provide cutting-edge performance and maximum uptime, making it the ideal choice for any production environment. With its flexible module configuration and multi-application capabilities, KLA AIT-XUV unit provides a comprehensive solution for wafer testing and metrology.