Used KLA / TENCOR AIT #293587187 for sale

KLA / TENCOR AIT is a High-throughput Automated Wafer Testing and Metrology equipment that enables the characterisation of parametric values and test patterns for product development and monitoring. The system has been developed for advanced semiconductor manufacturing and is used for verifying device parameters and features. At the heart of KLA AIT unit is its Universal Interface Module (UIM), which is used to manipulate and control device test configurations and enables the analysis of vital test signatures. This gives designers the ability to make objective decisions when characterising device performance. Additionally, the UIM facilitates the measurement of device-level parameters, enabling accurate evaluation. The main components of TENCOR AIT include multiple stages for testing and metrology. This includes a high precision autosampler that can handle a wide range of samples and an integrated alignment machine. The alignment tool is able to image devices fast enough to meet the high throughput requirements of semiconductor fabrication. The UIM enables AIT to distinguish the results of multiple test channels in an efficient way. Furthermore, the UIM performs sophisticated signal processing and calibration measurements. This is essential in order to obtain accurate results at the device-level. In addition to the UIM, KLA / TENCOR AIT contains a multi-channel high speed digitizer. The digitizer is designed to acquire and store the test signals. Real time data analysis is enabled by a dedicated software package, which can be used to quickly move data from all the test channels onto a central, single-viewable display. Many different interfaces can be used with KLA AIT, including Ethernet, PCI, Serial, and USB. This flexibility in interfacing options allows the asset to easily integrate with existing semiconductor chips. The UIM also supports Device Identifier Interfaces and embedded Contacts, making auto vs manual test mode switching between devices easier and faster. TENCOR AIT is an invaluable tool for advanced semiconductor manufacturing. It combines the speed and accuracy of automatic testing and metrology with the flexibility of a universal interface. With its large capacity, fast throughput, and comprehensive data acquisition, AIT is the perfect solution for measuring device-level parameters and testing intricate device structures.