Used KLA / TENCOR AIT #9250959 for sale

KLA / TENCOR AIT is a state-of-the-art Surface Analysis Equipment designed to provide wafer testing and metrology applications such as high-speed wafer mapping and wafer-scale assessment. This system is used to perform quickly and accurately discriminating process results on today's demanding wafers. Its high resolution imaging capabilities store and display up to 12 million data points per wafer and assist in evaluating wafer quality. KLA AIT unit uses high resolution video imaging and advanced embedded software from KLA RiskMonitor platform to provide comprehensive and powerful wafer testing and characterization. TENCOR AIT users benefit from the machine's large data-capture maps of 2 cm /min in 8 directions, which shorten turnaround times and optimize test times. The non-contact metrology tool is also geared towards more precise defect detection than other comparable inspection and metrology systems, making it a very desirable tool for advanced process control applications. AIT asset can be used for both in-line and off-line applications. Its powerful and flexible in-line tools are optimized to incorporate fast collection and analysis cycles that help ensure efficient process flow. Additionally, its off-line tools provide detailed information about the wafer surface, defects, and any non-uniformity that needs to be addressed. This capability enables users to gain a comprehensive understanding of their wafer's microstructure. The model also offers in-depth wafer dicing synchronization, which assists in reducing testing time. Moreover, KLA / TENCOR AIT equipment creates detailed output log records which enable traceability and are stored for future reference. This improves the accuracy, reliability and repeatability of wafer tests. KLA AIT offers the latest technology for wafer testing and metrology. The system is designed to meet the needs of both high-end and entry-level wafer fabrication processes and offers a comprehensive set of metrology tools. The unit provides reliable, accurate and comprehensive assessment of wafers, with fast, large data capture maps and detailed output records. This makes TENCOR AIT a great tool for improving process efficiency and ultimate yield.