Used KLA / TENCOR AIT #9296265 for sale

KLA / TENCOR AIT, a wafer testing and metrology equipment, is an advanced imaging and analysis tool designed to help identify and address defects in next-generation wafers. The system provides highly detailed 2D and 3D imaging, analysis and reporting of a wafer's full surface area. It is designed for tasks such as defect classification, print-through defects, proper placement verification, chipping inspection, and bridging failure analysis. KLA AIT unit offers various types of advanced imaging such as bright field imaging, auto-focussed image capture, and a variety of automated inspection techniques. Its advanced imaging and analysis machine provides sophisticated and fast identification of defects and offers high sensitivity to detect even small defects. It allows users to quickly categorize and prioritize defects, identify trends in their production processes, and ultimately improve device yield. TENCOR AIT tool provides characterization of wafers including statistics, defect density mapping, line width analysis and patters recognition. It also offers integrated defect review capabilities, provides quick feedback on failure analysis, and helps users isolate problem areas. Furthermore, the asset offers an automated surface defect inspection and process integration capabilities allowing for high-speed die-to-die or wafer-to-wafer comparison. In addition, AIT can be used to identify trends in metrology data from multiple tools and provides various reporting options such as wafer report and defect summary with a concise graphical output. Its user-friendly interface and automated operation are also designed to help users rapidly set up and execute different types of inspections quickly and accurately. Overall, KLA / TENCOR AIT is a powerful tool for wafer testing and metrology that enables users to efficiently identify, isolate, and address defects in next-generation wafers. It is an invaluable resource for device yield improvement and process optimization, assuring the production of high-quality devices with decreased cost.