Used KLA / TENCOR Aleris 8330 #9251027 for sale

KLA / TENCOR Aleris 8330 is a wafer testing and metrology equipment that provides a comprehensive range of inspection and metrology capabilities for both PCBs and wafers. The system features a choice of either optical, acoustic or impedance sensing capabilities to enable non-destructive evaluation of surfaces and the contact unit. It also features KLA advanced 1-micron depth resolution technology for the ultra-high resolution measurement and analysis of defects. The machine provides the ultimate in accuracy and ease of use and is designed for high-throughput operations. KLA Aleris 8330 tool utilizes a robust, air-guided transport asset that enables non-contact access for both wafers and PCBs. The model integrates a wide variety of measurement techniques designed to meet the most demanding surface inspection requirements. Such techniques include laser imaging, acoustic microscopy, electrical capacitance measurement (ECM), electrical potential measurement (EPM), voltage-challenged imaging (VTI), frequency-challenged imaging (FCI), etc. The equipment is equipped with an advanced computer-controlled user environment, which is easy to use and allows for real-time data capture. This greatly improves efficiency and accuracy when capturing data. The system also features dedicated Analysis and Visualization software for intuitive visual inspections of anomalies and subsurface defects. The built-in automated report generation helps to speed up the review of results. Furthermore, the unit also integrates a High-Resolution Etching Station, which provides a full range of chemical etches and pre-pattern measurements for reliable metrology and defect inspections. The machine also comes equipped with a powerful integrated Metrology suite, which allows for the detailed inspection and analysis of defects and other irregularities encountered on either wafers or boards. TENCOR Aleris 8330 tool is one of the best surface inspection systems currently available. Its combination of precision, accuracy, reliability and ease of use make it an ideal choice for those seeking an efficient and comprehensive wafer testing and metrology asset.