Used KLA / TENCOR Aleris Hx8500 #9281738 for sale

KLA / TENCOR Aleris Hx8500 Wafer Testing & Metrology Equipment is an advanced automated optical inspection (AOI), defect review, and non-destructive testing solution that offers a comprehensive set of advanced testing capabilities. The system is engineered to deliver the highest level of throughput in a compact footprint. The unit operates on wafers up to 8-inches in diameter, with a test area of up to three feet. KLA Aleris Hx8500 utilizes a two-dimensional imaging machine to inspect patterns in wafers up to 8" in diameter. High-resolution images are acquired and digital lenses are used to support measurement of both tiny features and overall substrates. The advanced lighting tool provides a range of optical configurations to detect a variety of different wafer defects, including scratches, holes, and defects in line widths, shapes, depths, and alignment. TENCOR Aleris Hx8500 also features a powerful inspection engine that captures and records wafer data for review. The asset also offers statistical image analysis software that can be used to support reliable quality control decisions. The easy-to-use interface allows users to quickly set up and customize inspections, and the automated workflow optimization helps to maximize inspection efficiency. The model also provides a comprehensive set of wafer testing capabilities, including patented automatic test program validation, guard band optimization, parametric test program generation, parametric scan and fail retention, and pattern defect detection and analysis. These features are designed to provide the most advanced and accurate wafer testing capabilities in a compact package. To ensure reliable wafer testing results, the equipment also comes with features such as automated defect site registration, registration defect image capture, full-sized image capture, and full wafer inspection. Additionally, the system offers an optional AutoRX integrated calibration unit to ensure accurate measurement results. To ensure maximum efficiency, the machine is also equipped with a suite of data management tools, such as a centralized database, a data logging tool, and a reporting asset. These features enable users to easily track test results, generate reports, and maintain an organized wafer data archive. Aleris Hx8500 Wafer Testing & Metrology Model is an advanced wafer testing solution designed to provide an effective and cost-efficient way to inspect and evaluate wafers for defects. The equipment's comprehensive set of features provides reliable testing, efficient workflow optimization, and data management capabilities, making it an invaluable tool for quality control and defect analysis.