Used KLA / TENCOR Alpha Step 100 #192922 for sale

KLA / TENCOR Alpha Step 100
ID: 192922
KLA / TENCOR Alpha Step 100 is a wafer testing and metrology equipment designed to be a cost-effective solution for quality control and yield improvement in semiconductor production. This system offers a wide range of options and features to suit virtually any need in wafer measurements and testing. Using KLA Alpha Step 100, users can quickly test and measure wafers with high accuracy and speed. The unit's optical machine consists of a digital camera and a laser-based illumination tool, with an automated focus controller to ensure optimal image quality. The on-board image processing asset automatically performs a range of measurements including defect detection, feature recognition, and non-contact defect assessment, all of which can be controlled via an intuitive graphical user interface. TENCOR Alpha Step 100 also offers advanced data analysis capabilities, including the ability to track wafer parameters such as device yields, defect sizes, location, etc., enabling manufacturers to quickly identify potential yield issues. To enable users to configure the model for a variety of applications, users can choose from a variety of probes and optics, a rotatable mount, and the option of modifying the equipment to accept either CCD or CMOS sensors. Alpha Step 100 is also integrated with KLA patented Lot Process Energy Analysis (LPEA) software, which provides quick and intuitive understanding of device characteristics and process trends over time. This helps manufacturers quickly identify and address process deviations associated with device performance and yields. Overall, KLA / TENCOR Alpha Step 100 is an efficient and cost-effective solution for wafer testing and metrology, providing users with the ability to rapidly inspect and analyze wafers with a high degree of accuracy. It is easy to configure and use, and its powerful features and integrated software enable users to quickly assess wafer performance and yield and identify potential issues.
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