Used KLA / TENCOR Alpha Step 100 #9212962 for sale

ID: 9212962
Surface profiler.
KLA / TENCOR Alpha Step 100 is a wafer testing and metrology equipment manufactured by KLA Corporation. The system is a fully automated die-to-database wafer step-and-scan unit that provides nanometer-level accuracy for the characterization of advanced semiconductor wafers during development, manufacturing, and quality control. KLA Alpha Step 100 features an ultra-precise stages and an advanced optics machine that can accurately measure features as small as 1nm. In addition, the tool uses an intrinsic wafer-level measurement capability to capture each die on the entire wafer, and its advanced cross-platform software makes it easy to access real-time information on die location, yield, yield trends, and specific performance data. The asset also includes a wide variety of die-level tests, including liner and flat morphing, line width position, CD uniformity, line-edge roughness, and surface profile measurement. Using a combination of step-scanning imaging technology and various optical techniques, the model is capable of measuring feature sizes down to 0.15μm. This makes TENCOR Alpha Step 100 well-suited for measuring the characteristics of highly advanced holographic tapes, CCDs, displays, and other structures. In addition, the equipment is designed to provide extremely accurate results for the materials tested, increasing production time and efficiency. The robust design also increases accuracy and eliminates false readings. This helps ensure that the wafer test results are of the highest quality. To ensure the most precise and repeatable measurement results, Alpha Step 100 is designed with an air bearing table mounted on a granite base, combined with industrial-grade optical components. The system also includes intuitive user controls, such as context-sensitive menus and intuitive LCD displays, for easy usage and fast data retrieval. Overall, KLA / TENCOR Alpha Step 100 is an accurate, reliable, and easy-to-use wafer testing and metrology unit that provides nanometer-level accuracy for the characterization of advanced semiconductor wafers. With its high accuracy, low failure rate, and robust design, the machine is ideal for research and development, manufacturing, and quality control purposes.
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