Used KLA / TENCOR Alpha Step 200 #293589847 for sale

KLA / TENCOR Alpha Step 200 is a state-of-the-art wafer testing and metrology equipment designed for advanced semiconductor manufacturers. It is ideal for applications such as high precision surface topography measurements, third order surface roughness measurements, microscopy, thickness measurements, and electrical testing. KLA ALPHASTEP 200 features a lightweight and compact design, making it the most suitable for bench-top operations. It is equipped with a 5-axis motion system that allows for precise scanning and 3D-profiling of wafers. The motion unit provides exact control over the movement of the chamber's head, allowing the user to accurately target specific locations on the wafer or sample. It also includes a high-resolution optical imaging machine which allows users to view and analyze samples of interest in great detail. The tool can measure wafers up to 8" in diameter and has a maximum sample weight of 15 lbs. A specialized, non-contact optical asset is employed to measure the sample's surface. This method, known as white-light interferometry, allows for higher resolution images than traditional scanning electron microscopy. This enables highly detailed and accurate surface topography mapping. Furthermore, the model is designed for ease of use and offers an intuitive user interface. The equipment is powered by Windows X operating system, which simplifies day-to-day use, data acquisition, and analysis. It comes with a complete range of imaging, software, and analysis packages for efficient data and image processing. In addition, a suite of specialized inspection modes and features make it suitable for a variety of testing applications. TENCOR ALPHA-STEP 200 is particularly well-suited for metrology and inspection across a wide range of semiconductor material structures, and offers excellence in efficiency, accuracy, and repeatability. It is the perfect choice for advanced semiconductor manufacturers.