Used KLA / TENCOR Alpha Step 200 #293591829 for sale

KLA / TENCOR Alpha Step 200 is a wafer testing and metrology equipment that is used to analyze the physical and electrical characteristics of wafers. This system is equipped with a high resolution optics platform that provides superior measurement accuracy and robustness. The unit also utilizes a sophisticated scanning method in order to provide a wide range of test flexibility for various substrates. KLA ALPHASTEP 200 is capable of performing non-contact surface profilometry as well as fringe-field technology that allows measurements of shallow features down to 1 nanometer. This machine has advanced feature extraction with 10x scan magnification that allows for precise measurements of feature thickness, height, and width. It also has several metrology methods, including surface chemistry analysis, optical inspection, surface texture characterization, and nanoscale defect analysis. The tool allows for automated and repeatable measurements, making it ideal for conducting research and development experiments. Additionally, TENCOR ALPHA-STEP 200 has robust analytics that enable visualization of wafer feature and substrate performance. This is useful for data analysis and troubleshooting in the manufacturing environment. Further, this asset enables the quantitative analysis of data from individual wafers, grouped wafers, and batches. ALPHASTEP 200 has a graphical user interface (GUI) for ease of use and for data manipulation. This allows for greater control over data processes. The model also offers integrated traceability of measurement parameters, which ensures precise measurement results. Last, the equipment has automated process equipment compatibility for enhanced process integration. Overall, KLA / TENCOR ALPHASTEP 200 is an advanced wafer testing and metrology system that offers precise and repeatable measurements. The unit has a wide range of test flexibility and allows for automated data processing and analysis. It is ideal for research and development and has a graphical user interface to ensure precise measurements and easy data manipulation.