Used KLA / TENCOR Alpha Step 200 #293635764 for sale

ID: 293635764
Profilometer.
KLA / TENCOR Alpha Step 200 is a next-generation wafer testing and metrology equipment designed to enhance process control and enable yield improvement. The system measures surface topography, critical dimensions, and thickness with sub-nanometer accuracy, making it ideal for IC fabrication, semiconductor inspection, and advanced manufacturing environments. The unit features a 5-axis stage, providing unrivaled flexibility and accuracy in wafer testing and metrology. An intuitive graphical user interface helps optimize wafer testing processes, streamlining set-up and inspection tasks. A software environment offers integrated data management and statistical analysis capabilities. KLA ALPHASTEP 200 incorporates proprietary vision algorithms to identify and measure features with sub-nanometer accuracy. These algorithms are powered by an advanced proprietary artificial intelligence (AI) machine, designed to analyze data patterns and predict outcomes. This AI-driven approach allows for increased accuracy and repeatability in results. TENCOR ALPHA-STEP 200 offers a wide range of capabilities including defect inspection, overlay alignment and measurement, 3D encoders, wafer flatness, CD-SEM, and process-specific metrology functions. It also provides sub-micron resolution of surface profiles and thickness measurements. These capabilities allow for the detection of micron- and sub-micron-scale defects and process variations, enabling thorough quality control for advanced applications. With its enhanced accuracy and repeatability, ALPHA-STEP 200 enables increased process control and performance. It is the ideal choice for manufacturers seeking superior wafer testing and metrology solutions.
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