Used KLA / TENCOR Alpha Step 200 #293644262 for sale

KLA / TENCOR Alpha Step 200 is a comprehensive wafer testing and metrology equipment designed to provide users with the highest level of accuracy in the analysis, characterization and optimization of wafer quality. The system is the first of its kind to offer the ability to simultaneously monitor, image and measure a range of characteristics on a wide variety of substrates. It offers multiple view modes which allow users to inspect, measure and analyze different aspects of the substrates with a single imaging platform. The unit is well-equipped with automated, high-end capabilities that enable a broad range of wafer metrology operations. It has three imaging modes - Laser Line Scanning (LLS) enables surface topography mapping; Fourier Transform Infrared Spectroscopy (FTIR) allows highly detailed wafer composition analysis; and White Light Interferometry provides 3D imaging to enable nanometer-level resolution imaging and measurement. Advanced measurement features like Focus Variation and on-spot Adjust Focus allow characterization of the surface of the wafer for stress and step height measurement. Additionally, the machine offers a range of quality control algorithms and reporting features to help users monitor and enhance the quality of their substrates. The tool is highly efficient and accurate in its operations, capable of achieving a pixel pitch of 5nm and below with high precision. It also offers a wide range of dynamic range settings that enable users to maximize their results and accurately track their production yields. The asset has superior measuring accuracy and precision, which is enabled by its hybrid imaging technology and powerful hardware architecture. High-end tools such as Contrast Enhanced Edge Analysis (CEEA) and Focus Metrology enhance the metrology capabilities of the model while providing excellent performance. In addition, an advanced, self-calibrating autofocus aids in providing accurate results across different wafers. The equipment is designed to be user-friendly and easy to use, with a simple, intuitive graphical user interface that guides users through every step of the operation. Several built-in features such as automatic inspection setup and scan pattern selection help users save time and effort. Additionally, the system offers a range of visualization tools, including contour plots and three-dimensional contour plots of the wafer to help users compare the performance of different substrates. Overall, KLA ALPHASTEP 200 is an ideal unit for users looking for an efficient, accurate, and powerful wafer testing and metrology solution. With its robust set of features and capabilities, the machine is well-suited for a wide range of wafer testing and metrology applications.