Used KLA / TENCOR Alpha Step 200 #293746497 for sale

KLA / TENCOR Alpha Step 200 wafer testing and metrology equipment is a high-performance metrology platform for precision dimensional metrology, surface finish analysis and qualitative electrical measurements. Designed to provide metrology data at nanometer-scale accuracy, this system is ideal for use in semiconductor production, device characterization and process optimization. KLA ALPHASTEP 200 utilizes laser interferometry technology to provide high-precision measurements of surface features and features for microscopic structures including critical dimensions. With up to 10X resolution, the unit is able to analyze structures between 40nm and 100µm in size. It can also achieve extremely fast scanning speeds of up to 6 cm2/second - much faster than conventional optical techniques. TENCOR ALPHA-STEP 200 also performs qualitative electrical measurements such as oxidation depth and etch depth measurements, leakage current, contact resistance, and Moire measurements. In addition, the machine offers a variety of measurement modes, including RMS and peak-to-valley. All data is stored on its large capacity hard drive for easy analysis and sharing. TENCOR ALPHASTEP 200 integrates seamlessly into complex production environments, offering an unbeatable combination of performance, accuracy, repeatability and ease of use. It is designed with an intuitive user interface and automated tools such as recipe creation and data archiving. In addition, various measurement techniques available directly from the stepped probe tip provide extremely accurate wafer-level measurements. In conclusion, ALPHASTEP 200 provides an exceptionally strong combination of high-performance metrology, precision measurement and flexible software. This tool is particularly useful for production environments, as it offers an unbeatable combination of measurement speed, accuracy and repeatability.