Used KLA / TENCOR Alpha Step 200 #293792665 for sale

ID: 293792665
Surface profiler Step height standard ranges: 17.48 KÅ 1.38 µm VLSI Step height standard ranges: 17.46 KÅ 1.735 µm Trace range: 10,000 µm Stylus arm Drive belt LVDT Memory Speed control CPU Boards Linear bearings with tri-flow oil PC.
KLA / TENCOR Alpha Step 200 is a wafer testing and metrology equipment designed to measure the profile, flatness and step heights of wafer surfaces. It utilizes confocal imaging and laser triangulation technologies to provide very accurate measurements of the wafer's profile and height. The system's laser has a step capability of up to 200µm, allowing it to measure fine surface features and small step heights accurately. KLA ALPHASTEP 200 has a motorized linear stepper that moves the wafer along the z-axis and ensures precise movement of the laser into the plane of the wafer's surface. By measuring the position of the laser relative to the surface, the unit can map the profile of the wafer's front and rear sides. Additionally, it can measure variations in thickness and flatness across the wafer, as well as across multiple die. TENCOR ALPHA-STEP 200 also includes a patented polarization feature which allows it to measure both sides of the wafer simultaneously. This increases throughput and improves the accuracy of the machine. Additionally, the tool includes advanced pattern recognition and repair algorithms to ensure accurate measurements in challenging materials. ALPHASTEP 200 has a user-friendly touchscreen interface, which allows users to quickly and easily set up test parameters and monitor the testing process. Furthermore, it's compatible with KLA METboard Software, which enables users to visualize the results of testing, store data, and generate reports. This ensures users can quickly interpret and analyze test results. Overall, KLA / TENCOR ALPHA-STEP 200 is a reliable and accurate wafer testing and metrology asset. Its fast laser step and pattern recognition capabilities, combined with its user-friendly interface and advanced software, make it an ideal tool for measuring the profile, flatness, and step heights of semiconductor wafers.
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