Used KLA / TENCOR Alpha Step 200 #293817499 for sale

KLA / TENCOR Alpha Step 200 is an advanced wafer testing and metrology equipment designed to help improve the efficiency and yield of device fabrication. The system is designed to provide complete coverage of measurements needed to build and test wafer samples, including electrical characteristics such as total capacitance, breakdown voltage, dielectric constant, and resistivity. It also provides integrated characterization of dielectric thickness, surface topography, and gate oxide thickness. The unit is composed of a main unit, which houses the advanced optical and scanning electron microscope (SEM) capabilities, as well as the integrated data analysis tools. Using non-contact, non-destructive optical surface characterization, KLA ALPHASTEP 200 can measure dielectric thickness, surface topography, and gate oxide thickness of wafers without damage. Sophisticated SEM capabilities, coupled with powerful image analysis and measurement capabilities, can rapidly identify and characterize defects. The machine also includes advanced automation capabilities such as automated wafer metrology and wafer probing. Multiple probe cards can be used, and the automatic task sequencing feature eliminates the need for manual programming and eliminates operator-to-operator variations. TENCOR ALPHA-STEP 200 can also be customized with special pre-planning and post-processing capabilities. It is designed with a comprehensive set of measurement types which can be used in tandem with advanced characterization techniques to accurately measure wafers with various parameters. The tool is designed with a full suite of software components to enable wafer measurement, analysis, and reporting. Automated wafer mapping, pattern recognition, and data management features enable efficient and accurate wafer analysis. Furthermore, ALPHA-STEP 200 can be integrated with other KLA products and processes to create a holistic asset that can provide complete characterizing solutions from start to finish. In conclusion, KLA ALPHA-STEP 200 is a powerful and efficient model for wafer testing and metrology. It provides complete coverage of measurements needed for device fabrication, including electrical, optical, and scanning electron microscopic characterizations. Automated wafer metrology and wafer probing capabilities make KLA / TENCOR ALPHA-STEP 200 an ideal solution for high-yield wafer production. Additionally, its powerful software tools enable efficient wafer analysis, data management, and reporting.