Used KLA / TENCOR Alpha Step 200 #293827697 for sale

KLA / TENCOR Alpha Step 200
ID: 293827697
Wafer Size: 4"
Surface profiler, 4" Silicon Carbide (SiC).
KLA / TENCOR Alpha Step 200 is a wafer testing and metrology equipment designed to deliver fast and reliable measurement of wafer surfaces. Specifically, KLA ALPHASTEP 200 provides precise topographical characterization of a wide range of materials and features, including defects and features as small as 3.5nm. TENCOR ALPHA-STEP 200 consists of several key components: a reflectometer-based scanning head unit, a vertical positioning system, a sample mount, and a control console. The vertical positioning unit allows for precise adjustment of the scanning head unit. This is important for achieving precise measurements, as the head unit must be within microns of the wafer surface to accurately assess the topographical features. The scanning head unit is comprised of an array of optical sensors that are used to detect the topographical information of the sample surface. As the unit is moved across the sample surface, the optical sensors send information to the control console, which records the surface characteristics in real time. The data is then converted into a 3-dimensional image, allowing for easy analysis and interpretation. The sample mount is used to secure the sample, keeping it in place as the scanning head passes over it. The mount typically consists of a vacuum chuck, allowing for a wide range of sample sizes and shapes to be tested. Finally, the control console is used to control the operation of Alpha Step 200. It provides a user-friendly interface for setting up the machine, coordinating the scanning and measurement process, and collecting and analyzing the resulting data. In short, ALPHASTEP 200 is an invaluable tool for anyone looking to quickly and accurately measure and analyze the surface features of wafers. Its versatile design and accurate functionality make it a powerful and reliable wafer testing tool.
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