Used KLA / TENCOR Alpha Step 200 #9012731 for sale
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Surface profiler Model number: 10-02000 Programmable X-Y stage Video monitor, 9" Motorized and manual stage (3) Operating modes: Manual Semiautomatic Automatic Scanning stylus: 12.5 Micron radius Zoom video microscope: 40x to 120x Magnification Vertical resolution: 5 Angstrom (With ±160 k angstrom range, 5 nm with ±160 micro-meter range) Vertical sensitivity: Measures even smallest steps, 20 to 50 angstrom Horizontal resolution: 400 Angstrom Tracking force: User adjustable, 1 to 25 mg Maximum sample dimensions: 16.5 mm thickness, 162 mm diameter Power requirements: 90-130 VAC, 50/60 Hz, 120 VA max.
KLA / TENCOR Alpha Step 200 is a wafer testing and metrology equipment, designed for measuring and analyzing critical parameters of semiconductor wafers. The system uses a proprietary optical contrast technique that facilitates the inspection of samples with a wide range of substrates and coatings. KLA ALPHASTEP 200 provides a non-destructive method for analyzing a variety of topographical features of the surfaces of semiconductor wafers. It can measure surface profile, surface texture, etch pit density and critical dimension, as well as surface flatness and optical texture. A high speed line scan image processing unit is used to detect and locate defects in the wafer surface. The wafer can be measured at high precision in either manual or automated mode, allowing for reliable and repeatable analysis of the surface. TENCOR ALPHA-STEP 200 also includes advanced automated measurement and analysis software, providing a detailed report of the results. The software can analyze the data and provide both graphical representations of the results and statistical analysis of the entire sample. The machine is highly flexible, allowing users to customize the performance and parameters of each measurement. The modular design allows for easy installation and integration into an existing production or laboratory environment. TENCOR ALPHASTEP 200 also has a high throughput, allowing 200 wafers to be tested in a typical 8 hour shift. TENCOR Alpha Step 200 is designed to meet stringent industry standards, providing accurate, repeatable, and reliable results for a wide range of complex applications. The tool offers excellent precision, high accuracy, and low noise levels. The asset is designed for laboratory, production and research and development use, as well as for educational purposes. In summary, KLA / TENCOR ALPHA-STEP 200 is a powerful and versatile wafer testing and metrology model, designed for highly accurate and reliable measurements of a wide range of substrates and coatings. The equipment is highly configurable, allowing users to customize its performance and parameters to their specific requirements. The system also includes advanced automated measurement and analysis software, providing detailed and accurate results. KLA ALPHA-STEP 200 is designed to meet the stringent industry standards, providing highly repeatable and reliable results.
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