Used KLA / TENCOR Alpha Step 200 #9171312 for sale

KLA / TENCOR Alpha Step 200
ID: 9171312
KLA / TENCOR Alpha Step 200 is a wafer testing and metrology equipment that uses non-contact, non-destructive optical point-to-point mapping to measure the dimensions and other physical characteristics of a semiconductor wafer. It is capable of inspecting up to 40 wafers an hour for traceable dimensional data. It meets or exceeds the industry standard for wafer inspection, providing the ultra-high accuracy and high-resolution density data required to quantify features down to 3 nanometers. KLA ALPHASTEP 200 utilizes a 4-channel, double-beam optical system to acquire images on up to four different points on the wafer. The unit has a stage size of 20 micrometers that enables the measurement of testing for wafers up to 200 mm in size. It has a vertically adjustable upper and lower camera which can measure step height from 0.5 to 100 micrometers. Additionally, it is equipped with a simple and intuitive graphical user interface which makes operation of the machine much easier. The tool also includes advanced algorithms that provide reliable results with extremely low noise compared to other systems. It also features multiple data analysis tools such as spectral analysis and surface analysis which allow for in-depth analysis of the wafer. The asset can also interface with other third-party software systems to allow for more complex testing and analysis. TENCOR ALPHA-STEP 200 is an exceptionally reliable wafer testing and metrology model that is capable of providing detailed data on critical characteristics of semiconductor wafers. It is an ideal choice for critical measurements due to its precision and accuracy. By utilizing the latest advancements in optics and algorithms, the equipment is able to provide the accurate data that is essential for efficient and cost-effective production of semiconductor products.
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